News: XRF Systems, Applications, People

February, 2021 – Mumbai. Bowman and its India partner, Quantum Equipment Co. Pvt. Ltd., have debuted an important addition to their suite of benchtop XRF composition analysis systems.

The Q-series Karatmeter is a robust system, developed exclusively for the India market, that’s ideal for gold assay measurement and other precious metal analysis.

The two most distinctive features of the Q Series are “top-down” measurement using a manual Z-axis movement, and precision video imaging.

The standard Q-series Karatmeter includes a single fixed collimator, solid-state PIN detector, and long-life micro-focus x-ray tube. As with all Bowman models, the components can be upgraded to include multiple collimators, a variable focal camera, or an SDD detector.

Like others in the Quantum portfolio, Q-series Karatmeter XRFs simultaneously measure up to 30 elements in a single alloy. Element range is Al (13) through U (92.)

To quantify composition in the alloy from the detected photons, Q-series systems run advanced Xralizer software. Xralizer combines intuitive controls with time-saving shortcuts, extensive search capability, and “one-click” reporting. Equally important: Karatmeter XRFs are full-access instruments from the day of install: there are no dongles or lock-outs to complicate, delay, or add cost.

Bowman’s Q-series desktop XRF was developed for gold assay, quality labs and production environments. It is highly advantageous for users with limited benchtop space – or budget limitations. Q-series XRFs are ideal for both gold assay and alloy composition

September, 2020 – Bowman has successfully completed a full ISO assessment. The results: no “NC” (Non-conformity) and no “OFI” (opportunity for improvement).

It doesn’t get any better than this! Congratulations to the Bowman ISO Team: Ron Wochinski, Jeff Korpus, Vicky Huang, Brian Judge and Caryl Zulawinski.

September, 2020 – Bowman CTO Jun Choi announces the appointment of Frank Giuliani as Quality Assurance Engineer. Giuliani is an electrical engineer with core strengths in analytical instrumentation manufacturing, test and product engineering, and electromechanical systems design. He was previously a support engineer for Bruker, and for Oxford Instruments, where he enthusiastically provided technical support, troubleshooting, installations and training to customers and distributors internationally.

In his new post, Giuliani is responsible for developing and executing test plans to ensure the consistent high quality for which Bowman’s benchtop XRF instrumentation suite is known. Giuliani distinguished himself for this new role with research involving optical microscopy, photoluminescence spectroscopy, and atomic force microscopy, as well as photodetector design simulation.

Giuliani holds a BSE in electrical engineering, with specialties in analog and digital circuits, CMOS & MEMS, and digital signal processing. He will work closely with the development and sales teams, ensuring that Bowman continues to deliver as-designed, fully tested products to customers throughout North and South America, Europe and Asia.

August, 2020 – Bowman China Applied Scientific Instruments exhibits August 25-28 at the 29th International Electronics Circuit Exhibition (“CPCA”) at Shanghai’s National Exhibition and Convention Center. Bowman China will demonstrate the P Series XRF, a benchtop instrument distinctive in its ability to measure the widest range of sample sizes, shapes, and quantities. Collimators and focal distances can be customized to the applications, and a programmable X-Y stage offers significant convenience and ergonomic advantages compared with a fixed stage.