August, 2020 – Bowman China Applied Scientific Instruments exhibits August 25-28 at the 29th International Electronics Circuit Exhibition (“CPCA”) at Shanghai’s National Exhibition and Convention Center. Bowman China will demonstrate the P Series XRF, a benchtop instrument distinctive in its ability to measure the widest range of sample sizes, shapes, and quantities. Collimators and focal distances can be customized to the applications, and a programmable X-Y stage offers significant convenience and ergonomic advantages compared with a fixed stage.