Bowman has just published an eagerly-awaited applications bulletin detailing the capability of its XRF benchtop instruments to precisely measure PVD aluminum metalized finishes. These have become high-demand finishes for
diverse applications within the automotive industry and elsewhere, that require ultra-thin functional coatings.
The PVD process deposits a layer of high density material just a few nanometers thick. Bowman XRFs precisely measure PVD aluminum, also PVD chrome, both as a pure material, or alloy. The effective thickness range is 10-100nm, over an ABS or silicon substrate.
This capability is made possible in part by Bowman’s large Silicon Drift Detector. “SDDs” provide the best resolution, lowest noise level (highest S/N ratio), and shortest test times.
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