• Silver
• Gold
• Palladium
• Platinum
• Nickel
• Titanium

Bowman XRF systems provide a fast, accurate, non-destructive testing method for jewelry elemental analysis. XRF offers significant advantages in efficiency and ease-of-use over lengthy and destructive techniques such as fire assay and ICP.

Analysis of plated layers is essential for ensuring proper protection against corrosion and tarnishing, increasing durability, and achieving an attractive finish. It also prevents over plating and waste of expensive precious metals. Another major concern for jewelry markets is bulk-material analysis for purity and authenticity confirmation. Bowman systems are uniquely suited to accurately determine base composition while simultaneously measuring thicknesses of plating layers. All instruments come standard with solid state silicon drift detectors (SDDs), offering major advantages over proportional counters and silicon pin detectors:

• Increased energy resolution and sensitivity
• Capability to analyze light elements (down to 13-Al)
• High stability and accuracy for thin coating applications

Additionally, the close-couple geometry layout of the X-ray tube and detector provides more than three times higher counts, resulting in lower detection limits and improved precision with shorter measurement time. Combined with Bowman's state-of-the-art Archer software, which can measure up to 30 elements in a single layer, jewelry analysis has never been easier.

Assayers, manufacturers, showrooms, and pawn shops alike benefit from fast, reliable, analysis of plating thickness and base alloy composition provided by XRF.

Check out our application bulletin on Rhodium Plating on Gold Alloys to learn more.