W Series XRF
Bowman brand XRF System
The W Series uses poly-capillary optics to focus the X-ray beam to 7.5 µm FWHM, the world’s smallest beam size for coating thickness analysis using XRF technology. A 150X magnification camera is used to measure features on that scale; it is accompanied by a secondary, low-magnification camera for live-viewing samples and birds-eye macro-view imaging. Bowman’s dual-camera system lets operators see the entire part, click the image to zoom with the high-mag camera, and pinpoint the feature to be programmed and measured.
A programmable X-Y stage with precision less than +/- 1 µm for each axis is used to select and measure multiple points; Bowman pattern recognition software and auto-focus features also do this automatically. The system’s 3D mapping capability can be used to view the topography of a coating on a part such as a silicon wafer.
The standard configuration of W Series instruments includes 7.5 µm optics with molybdenum anode tube (chromium and tungsten are optional) and a high-resolution, large-window Silicon Drift Detector which processes more than 2 million counts per second.
The W Series is the 7th model in Bowman’s XRF instrument suite. Like others in the portfolio, it simultaneously measures up to 5 coating layers and runs advanced Xralizer software to quantify coating thickness from the detected photons. Xralizer software combines intuitive visual controls with time-saving shortcuts, extensive search capability, and “one-click” reporting. The software also simplifies user creation of new applications.
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The W Series XRF is most ideal for companies with:
- The need to test wafers, lead frames, PCBs
- Requirements to quickly test multiple samples or locations
- Desire to automate measurement on multiple samples
- The need to comply with IPC-4552A
|X-ray Excitation:||50 W Mo target Flex-Beam Capillary Optics @7.5 FWHM
Optional: Cr or W
|Detector:||Large window Silicon drifted detector with 135eV resolution or better|
|Focal Depth:||Fixed at 0.02″|
|Video Magnification:||150X with micro-view camera on 20″ screen (up to 600x digital zoom)
10~20X with macro-view camera
|Working Environment:||68°F (20°C) to 77°F (25°C) and up to 98% RH, non-condensing|
|Programmable XYZ:||XYZ travel: 300mm (11.8″) x 400mm (15.7″) x 100mm (3.9″)
XY tabletop: 305mm (12″) x 406mm (16″)
X-axis accuracy: 2.5um (100u”); X-axis precision: 1um (40u”)
Y-axis accuracy: 3um (120u”) ; Y-axis precision: 1um (40u”)
Z-axis accuracy: 1.25um (50u”) ; Z-axis precision: 1um (40u”)
|Element Range:||Aluminum 13 to Uranium 92|
|Analysis Layers and Elements:||5 layers (4 layers + base) and 10 elements in each layer.
Composition analysis of up to 25 elements simultaneously
|Primary Filters:||4 primary filters|
|Digital Pulse Processing:||4096 CH digital multi-channel analyser with flexible shaping time. Automatic signal processing including dead time correction and escape peak correction|
|Processor:||Intel, CORE i5 3470 (3.2GHz), 8GB DDR3 Memory,
Microsoft Windows 10 Prof, 64bit equivalent
|Camera Optics:||1/4″ CMOS-1280×720 VGA resolution|
|Power Supply:||150W, 100~240 volts; frequency range 47Hz to 63Hz|
|Dimensions (HxWxD):||Internal: 735mm (29″) x 914mm (36″) x 100mm (4″)
External: 940mm (37″) x 990mm (39″) x 787mm (31″)
|Other New Features:||Z axis crash protection array
Auto focus and focus laser
Advanced custom data transfer