Bowman Distributor Moves to New Headquarters

X-RAY NOW, Bowman’s exclusive distributor and support provider for California, Arizona, Nevada, Colorado, the Pacific Northwest and Mexico, has a new headquarters in Santa Ana, CA. X-RAY NOW has provided XRF coating thickness measurement systems for the PCB and semiconductor industries since 2001. It sells new and used XRF equipment, and provides service, repair and calibrations, and standards, too.

X-RAY NOW offers customer demos for Bowman equipment, either in their facility, or at the customer’s location. You can reach Zach, Phil and their highly experienced XRF team at 714-396-2519.

Bowman Featured at JPCA

JPCA (Japan Electronics Packaging and Circuits), was held in Tokyo June 6th through June 9th. Koichiro Hotta and his team at Flex Service Co., Ltd. demonstrated the Bowman P Series at this annual event, which last year drew 43,000+ attendees.


New XRF Instrument Measures the Smallest Features in Semiconductor / Microelectronics Manufacturing

June, 2018 Schaumburg, IL. – Bowman, a US manufacturer and global service provider for quality labs using XRF measurement technology, has introduced a new instrument for the smallest features in semiconductors and microelectronics.

Bowman’s W Series uses poly-capillary optics to focus the X-ray beam to 7.5 µm FWHM, the world’s smallest beam size for coating thickness analysis using XRF technology. A 150X magnification camera is used to measure features on that scale; it is accompanied by a secondary, low-magnification camera for live-viewing samples and birds-eye macro-view imaging. Bowman’s dual-camera system lets operators see the entire part, click the image to zoom with the high-mag camera, and pinpoint the feature to be programmed and measured.

A programmable X-Y stage with precision less than +/- 1 µm for each axis is used to select and measure multiple points; Bowman pattern recognition software and auto-focus features also do this automatically. The system’s 3D mapping capability can be used to view the topography of a coating on a part such as a silicon wafer.

The W Series is the 7th model in Bowman’s XRF instrument suite.

More on W Series XRF coating thickness analysis

Bowman China Shines at Conferences
Throughout May - and Throughout China

Bowman China exhibited Bowman XRF technology at major trade shows in Changzhou, Qingdao, and Chongqing.

The Changzhou event attracted 20,000 visitors from eastern China. The event in Qingdao, formally sponsored by Bowman, was the 5th Bohai Surfacing & Plating Forum, coordinated by the regional plating association. Chongqing Surface Finishing EXPO, in western China, attracted 12,000+ surface finishing professionals.

Congratulations to Arthur He and his team for 3 superb exhibits – and their captivating demonstrations of the P Series – the “small-feature XRF” that is also industry’s most flexible XRF in terms of sample sizes, shapes, and throughput.


Bowman Appoints UK Distributor

May, 2018 – Bowman has appointed SciMed, a distributor of scientific instruments, as exclusive distributor for Bowman XRF plating thickness measurement systems in the UK.

SciMed will represent Bowman XRF systems throughout the UK, and provide service and technical support. Bowman XRF equipment is tailored to the user’s specific needs, and includes a broad range, from entry-level instruments to elite, “best in class” systems for the most demanding microelectronics applications.

SciMed was established in 1979 in Stockport, Cheshire, and has become one of the UK’s most prominent distributors of laboratory and process equipment. It works with every sector of UK industry, but primarily advises scientists and technicians involved in microelectronics, metal plating, electrochemistry and elemental analysis.

SciMed owner Paul Vanden Branden introduced Bowman XRF technology at Surfex, the premier conference and trade event for the UK finishing industry, in Conventry, May 22-23.

Bowman Featured at CPCA

April, 2018 – Congratulations on a great and productive show to Bowman’s China Master Distributor, Arthur He, (Applied Scientific Instruments) for exceptional work (and a terrific exhibit!) at the China International PCB and Assembly Show.

The annual event was held March 20-22 at the National Convention and Exhibition Center in Shanghai, and showcased PCB equipment, raw materials and chemicals, electronic assembly equipment, and much more.

Bowman at CONTROL

April, 2018 – Congratulations also to Andreas Prager and Dietmar Denker, directors of DEPraTechnik GmbH & Co., who brought Bowman XRF technology front and center at Germany’s CONTROL trade show April 24-27, in Stuttgart.

DEPraTechnik GmbH & Co. manages Bowman equipment sales and service throughout Germany. CONTROL is the International Trade Fair for Quality Assurance, and is the leading event in the quality sector, with 30,000 visitors annually.

New XRF Measurement System Designed for Metal Finishers

Who Benefits?

  • Finishers who need to precisely measure coating thickness on automotive parts, plumbing components, cutting tools and other large samples
  • Finishers who want an XRF measurement system that does “triple duty” – performing coating analysis, solution analysis and element analysis with one instrument
  • Finishers who need to comply with the new IPC specification, 4552-A, for printed circuit board plating

December, 2017: Bowman has introduced its large component “L Series” XRF for parts measuring up to 22″ X 24″ X 13″.

The Bowman L Series desktop instrument was engineered for OEMs and contract shops who need precise control over the thickness of plated deposits, preventing the quality issues that result from under-plating, and the cost consequences of over-plating.

The Bowman L Series XRF quickly and precisely determines the thickness of coatings within a broad range: from aluminum through uranium (13 through 92 on the periodic table.) The instrument measures up to five coating layers simultaneously, any or all of which can be alloys.

Key Features of L Series units include Bowman’s proprietary micro spot focus x-ray tube, and temperature-stabilized silicon PIN diode detector. The detector has well-defined element peaks, eliminating the need for secondary filters. Minimal peak position drift assures highest stability over time and extends the interval between recalibrations.

Unique to Bowman XRF instruments is the intimate proximity of the X-ray tube and detector, a feature of system architecture that produces more than three times the photon counts of conventional XRF equipment – and in a shorter measurement time.

More on L Series XRF coating measurement

Bowman Appoints Lead XRF Scientist


February 19, 2018 Schaumburg, IL – Bowman, a US manufacturer of XRF coating measurement instruments, announces the appointment of Dr. Timothy He as Principal XRF Scientist.

In making the appointment, Bowman Chief Technology Officer Jun Choi, says, “Tim He will report directly to me, and will have two primary responsibilities. He will be responsible for the expansion of applications for Bowman XRF coating measurement technology, with a focus on EPIG, ENEPIG, and other PCB applications; he will also lead Bowman’s development team for materials integrity testing.”

Dr. He was previously Principal Scientist with Tribogenics, Inc., a manufacturer of triboluminescence-based X-ray products based in Los Angeles. Previous to that, he was Senior Detectors Scientist at Bruker Corporation.

“With his broad, but highly relevant background,” adds Choi, “Tim He is an extraordinary addition to our technical team.”