Electronic components are only getting smaller, so it’s important to address decreasing feature sizes. This means that the x-ray beam must be small enough to focus on very small areas. Bowman offers a range of collimator sizes; for the smallest components, there are several poly-capillary optics alternatives ranging from 7.5-80 µm FWHM.

Bowman also offers a range of chassis and sample stage sizes to accommodate a broad range of part sizes and testing volumes. Many of our customers work with very small parts such as pin connectors, and also need to measure multiple samples per lot of parts to satisfy customers’ sampling requirements. Often, they use custom fixtures to consistently present small samples to the XRF system. All Bowman benchtop XRFs allow multi-point programs to be created, saved, and recalled in order to automate testing for multiple parts. A programmable XY stage, combined with built-in pattern recognition software makes high volume sample testing both efficient and consistent.

Bowman systems use exclusively silicon drift detector (SDD) technology for best performance. SDDs offer the best resolution, lowest noise level (highest S/N ratio), long-term stability, and shortest test times. They can also measure %P directly in electroless nickel deposits. Combined with Bowman’s highly reliable x-ray tube, this hardware combination is the solid core of every Bowman XRF system- and a key reason why our benchtop XRFs deliver the best all-around performance and reliability in the industry.

Electronic component testing requirements vary to the degree that it’s difficult to identify one model or even several that would be most beneficial. Visit our products page, use our contact form, or call us, and one of our specialists can recommend the most advantageous instrument for your test environment and budget.