News: XRF Systems, Applications, People

September, 2020 – Bowman has successfully completed a full ISO assessment. The results: no “NC” (Non-conformity) and no “OFI” (opportunity for improvement).

It doesn’t get any better than this! Congratulations to the Bowman ISO Team: Ron Wochinski, Jeff Korpus, Vicky Huang, Brian Judge and Caryl Zulawinski.

September, 2020 – Bowman CTO Jun Choi announces the appointment of Frank Giuliani as Quality Assurance Engineer. Giuliani is an electrical engineer with core strengths in analytical instrumentation manufacturing, test and product engineering, and electromechanical systems design. He was previously a support engineer for Bruker, and for Oxford Instruments, where he enthusiastically provided technical support, troubleshooting, installations and training to customers and distributors internationally.

In his new post, Giuliani is responsible for developing and executing test plans to ensure the consistent high quality for which Bowman’s benchtop XRF instrumentation suite is known. Giuliani distinguished himself for this new role with research involving optical microscopy, photoluminescence spectroscopy, and atomic force microscopy, as well as photodetector design simulation.

Giuliani holds a BSE in electrical engineering, with specialties in analog and digital circuits, CMOS & MEMS, and digital signal processing. He will work closely with the development and sales teams, ensuring that Bowman continues to deliver as-designed, fully tested products to customers throughout North and South America, Europe and Asia.

August, 2020 – Bowman China Applied Scientific Instruments exhibits August 25-28 at the 29th International Electronics Circuit Exhibition (“CPCA”) at Shanghai’s National Exhibition and Convention Center. Bowman China will demonstrate the P Series XRF, a benchtop instrument distinctive in its ability to measure the widest range of sample sizes, shapes, and quantities. Collimators and focal distances can be customized to the applications, and a programmable X-Y stage offers significant convenience and ergonomic advantages compared with a fixed stage.

August, 2020 – Bowman CTO Jun Choi announces the appointment of Brian Judge as Applications/Support Engineer. In his new post, Judge is responsible for new standards certifications, recertification of existing standards, and both remote and on-site system support.

Regarding the latter, Judge is distinctly qualified: during his previous 3-year tenure as a Bowman Production Engineer, he built the line used to manufacture benchtop XRFs, and performed QC checks on equipment. As a result, his knowledge of the inner workings of XRF measurement instruments, as well as the advanced XRalizer software that runs all Bowman systems, is broad and deep.

Judge received an ME from Southern Illinois University.

July, 2020 – Bowman Mexico, and RAISA, its distributor, have announced they will supply a comprehensive line of Reference Standards for all benchtop and hand-held XRF plating measurement systems. Reference standards are a critical quality control tool for any manufacturer of products that are plated, and for contract plating shops that serve both manufacturers, and the printed circuit board / semiconductor industry.

Bowman Mexico will stock, for rapid availability, standards for ENIG and ENEPIG, as well as thin precious metals, percent phosphorus, electroless nickel, chrome, zinc-nickel, and other common alloys. The company will also provide custom standards.