April, 2018 – Congratulations on a great and productive show to Bowman’s China Master Distributor, Arthur He, (Applied Scientific Instruments) for exceptional work (and a terrific exhibit!) at the China International PCB and Assembly Show.
The annual event was held March 20-22 at the National Convention and Exhibition Center in Shanghai, and showcased PCB equipment, raw materials and chemicals, electronic assembly equipment, and much more.
April, 2018 – Congratulations also to Andreas Prager and Dietmar Denker, directors of DEPraTechnik GmbH & Co., who brought Bowman XRF technology front and center at Germany’s CONTROL trade show April 24-27, in Stuttgart.
DEPraTechnik GmbH & Co. manages Bowman equipment sales and service throughout Germany. CONTROL is the International Trade Fair for Quality Assurance, and is the leading event in the quality sector, with 30,000 visitors annually.
February, 2018 – Bowman, a US manufacturer of XRF coating measurement instruments, announces the appointment of Dr. Timothy He as Principal XRF Scientist.
In making the appointment, Bowman Chief Technology Officer Jun Choi, says, “Tim He will report directly to me, and will have two primary responsibilities. He will be responsible for the expansion of applications for Bowman XRF coating measurement technology, with a focus on EPIG, ENEPIG, and other PCB applications; he will also lead Bowman’s development team for materials integrity testing.”
Dr. He was previously Principal Scientist with Tribogenics, Inc., a manufacturer of triboluminescence-based X-ray products based in Los Angeles. Previous to that, he was Senior Detectors Scientist at Bruker Corporation.
“With his broad, but highly relevant background,” adds Choi, “Tim He is an extraordinary addition to our technical team.”
January, 2018 – Congratulations to Arthur He, Bowman’s China Master Distributor, on a highly successful HKPCA* show and conference. All 5 Bowman Asia distributors work under Arthur’s excellent leadership, and attended Bowman’s regional distributors meeting during the event, which was held recently in Shenzhen.
His company is Applied Scientific Instruments Co., headquartered in Shanghai.
* Hong Kong Printed Circuits Association
Shown (from left): Arthur He, President of Applied Scientific Instruments; Jun Choi, Chief Technology Officer, Bowman; Tom Tang, owner of Digitop Electronics Ltd., Bowman’s distributor for southern China, with sales personnel.
December, 2017 – Bowman has introduced its large component “L Series” XRF for parts measuring up to 22″ X 24″ X 13″.
The Bowman L Series desktop instrument was engineered for OEMs and contract shops who need precise control over the thickness of plated deposits, preventing the quality issues that result from under-plating, and the cost consequences of over-plating.
The Bowman L Series XRF quickly and precisely determines the thickness of coatings within a broad range: from aluminum through uranium (13 through 92 on the periodic table.) The instrument measures up to five coating layers simultaneously, any or all of which can be alloys.
Key Features of L Series units include Bowman’s proprietary micro spot focus x-ray tube, and temperature-stabilized silicon PIN diode detector. The detector has well-defined element peaks, eliminating the need for secondary filters. Minimal peak position drift assures highest stability over time and extends the interval between recalibrations.
Unique to Bowman XRF instruments is the intimate proximity of the X-ray tube and detector, a feature of system architecture that produces more than three times the photon counts of conventional XRF equipment – and in a shorter measurement time.
More on L Series XRF coating measurement
Previous edition also available online
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