June, 2022 – Brett Algrim has joined the Bowman Headquarters Team as our newest Standards Lab Technician/Applications Engineer.
Brett brings specialized skills in laboratory management and techniques, gas chromatography, IR spectroscopy, and HPLC as well as statistics. He has a B.A from Iowa State University and Masters level education in organic chemistry.
May, 2022 – Bowman has introduced an important addition to its suite of precision XRF instruments used in the PCB, semiconductor and microelectronics industries.
The Bowman A Series Micro XRF quickly measures the smallest features on semiconductors and microelectronics. It accommodates very large PCB panels, and wafers of any size, for full sample coverage and multi-point programmable automation.
Poly-capillary optics focus the X-ray beam to 7.5 µm FWHM, the world’s smallest for XRF coating thickness analysis. A 140X magnification camera measures features on that scale; a secondary, low magnification camera provides live-viewing of samples and “birds-eye” macro-view imaging. Bowman’s proprietary dual-camera system lets operators see the entire part, click the image to zoom with the high-mag camera, and quickly identify the feature of interest.
A programmable X-Y stage with movement of 23.6 in (600 mm) in each direction can handle the largest samples in the industry. The stage has precision down to +/- 1 µm for each axis, and is used to select and measure multiple points; Bowman pattern recognition software and auto-focus features also do this automatically. The system’s 3D mapping capability can be used to view the topography of ENIG, ENEPIG, EPIG and other elite processes.
A Series instruments include 7.5 µm optics with molybdenum anode tube (chromium and tungsten also available) and a high-resolution, large-window Silicon Drift Detector (SDD) which processes more than 2 million counts per second. SDDs are the standard, industry-wide, for complex thin films. The high count rate capability is key to achieving a low minimum detection limit (MDL) and highest spectral resolution.
A Series systems are distinctive in that they are cleanroom-ready, have the largest semiconductor stage movement on the market, and are supported worldwide by a service network that provides same-day response for every benchtop XRF requirement. Equipment evaluation, selection, commissioning, maintenance and modernization is available for users of Bowman instruments, as well as other major XRF brands.
Rendering of A Series for Incorporation with Automated Wafer Handler
April, 2022 – Quantum owners DM Musale and Vaishali Dake-Musale (4th and 3rd from left, respectively) led their sales and tech support team to a successful exhibit at JMAIIE, Asia’s largest trade event for equipment used in the jewelry industry.
March, 2022 – Experiments and published articles on various topics related to materials science often use Bowman XRF systems for precise plating thickness measurements and plating bath analysis.
Most recently, a notable study titled “Optimisation of Thiourea Concentration in a Decorative Copper Plating Acid Bath Based on Methanesulfonic Electrolyte” used a Bowman P Series XRF system. Like all Bowman XRF instruments, the P Series uses a solid state detector for highest resolution, low baseline noise and high overall stability. The study was published by Coatings, a peer-reviewed journal of coatings and surface engineering published monthly by MDPI.
March, 2022 – Brian Judge, Midwest Technical Sales & Support Engineer, will be the featured speaker at Michigan NASF’s meeting, Saturday, March 12 at historic Paddock Place in Grand Rapids. His talk will cover XRF Capabilities, Limitations and Considerations.
Previous edition also available online
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