News: XRF Systems, Applications, People

December 9, 2021 – Xin Jiang has joined Bowman as Principal Electrical/Firmware Engineer. He holds an MSE (Master of Science, Electrical Engineering) and has 30+ years of experience in digital circuits, embedded software, and product design. He has an impressive record with UL, CE, and FDA compliance and testing, and will lead Bowman’s effort in designing electronics for automated XRF tools and next-generation instruments.

In his previous posts, he specialized in HPLC chromatography and X-ray technology for medical device applications, and was a consulting test engineer for Teradyne, a semiconductor test equipment provider.

His responsibilities at Bowman cover firmware, product design, and regulatory compliance; he reports to Engineering Manager, Robert Magyar

November, 2021 – Ryan Ahrens, Rob Coleman, Brian Judge and Dana Woodson represented Bowman at SUR-FIN 2021 in Detroit. Of particular interest at this show was the Bowman L Series, which accommodates parts up to 24″ in any dimension and is ideal for fixtured parts requiring automated multi-point measurement. 3 of the 7 systems in the Bowman XRF suite were developed specifically for metal finishers.

September, 2021 – Bowman Applications Engineer, Brian Judge, has been promoted to Midwest Technical Sales & Support Engineer. In his new position, Judge manages equipment service and repair, as well as XRF sales, for the important 9-state Midwest region.

Vladimir Korolchuk has joined the Bowman Global Partnership, becoming the company’s exclusive representative for technical sales and service throughout Texas. Korolchuk’s headquarters is Pasadena, TX, a suburb of Houston, America’s 4th largest market.

July, 2021 – Bowman G and L Series XRFs have become industry’s best alternative for quickly and precisely identifying hazardous substances covered in the RoHS 3 Directive. Conventional XRF instruments are limited to the measurement of spot sizes Φ10mm or larger, making it difficult to measure most electrical parts which are smaller, and/or have an irregular shape.

New generation Bowman G and L Series XRFs were engineered to meet the evolving needs of the electrotechnical industry. The maximum measurement spot size of a Bowman XRF is Φ1.5mm. (The minimum spot size, used for high-end electrotechnical and semiconductor applications, is Φ 0.01mm.) Small X-ray spot capability, a factory-calibrated RoHS package and powerful, intuitive software provide companies throughout the electronics supply chain with a reliable and cost-effective quality tool.

July, 2021 – Bowman China Applied Scientific Instruments is one of the main highlights of this year’s 30th International Electronics Circuit Exhibition July 7-9 at Shanghai’s National Exhibition and Convention Center. The show is managed by China Printed Circuit Association (CPCA) and features more than 500 exhibitors.

Bowman China will showcase P, B, L, and G Series XRF systems in a unique virtual presentation on the show floor. Visit Arthur He and his expert team in booth 8Y28.