SDDs provide the best resolution, lowest noise level (highest S/N ratio), long-term stability, and shortest test times. They also measure %P directly in electroless nickel deposits. Combined with Bowman's highly reliable x-ray tube, this hardware duo represents a solid core in every XRF system we offer.

Whether you're measuring ENIG, ENEPIG, HASL, electroless nickel, %P, RoHS, or another PCB application, Bowman has the perfect solution for your requirements. With a full range of models and hardware options, our experts can help identify the best fit for your needs.

The two most popular models for PCB analysis are the P and B Series systems. The P Series includes a multi-collimator assembly to accommodate a variety of pad sizes multiple programmable XY stage sizes and travel ranges. The B Series is the most affordable option and offers the same measurement performance of the P Series, without the programmable stage or multiple collimator sizes.

If your feature sizes approach 100 µm or smaller, Bowman offers poly-capillary optics systems which combine a very small x-ray beam size with high flux levels. As collimator sizes decrease, the amount of x-rays (flux) decreases in tandem. This directly affects repeatability and increases the required test times to achieve acceptable results. Poly-capillary optics offers the most effective solution for very small features, and Bowman offers beam sizes down to 7.5 µm FWHM, the smallest in the industry.