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Many of the application briefs and journal articles listed here reference IPC 4552 capability. As of 2024, all Bowman XRF systems are fully IPC 4552 capable, including all current revisions.

Bowman Brochure Semiconductor Brochure IC Substrates Brochure Standards Flyer Bowman RoHS Brochure K Series Collimated Flyer K Series Optics Flyer A Series Flyer W Series Flyer L Series Flyer M Series Flyer O Series Flyer P Series Flyer B Series Flyer G Series Flyer Bowman Application Brief on IPC-4552 Application Bulletin 1.1 - Performance on Thin and Thick Electroless Nickel Plating Application Bulletin 2.1: ENEPIG IPC-4556 Application Bulletin 3.1 - Measurement of ENIG %P Under the Au Layer Application Bulletin 4 - Compliance of Bowman XRF Instruments with IPC-4552 Application Bulletin 5 - Au/Ni/Kovar Application Bulletin 6 - Thickness Measurement of Sn and Ni Layers on Resistors and Capacitors Application Bulletin 7 - Nanometer Level Indium Coating Thickness Measurement for the Automobile Industry Application Bulletin 8.1 - Measurement of Ni-Cu-Ni In the Magnet Industry Application Bulletin 9 - Composition & Thickness Measurement of Zn-Ni Alloy Coatings Application Bulletin 10 - Termination Plating Analysis of Capacitor - Resistor and Inductor Application Bulletin 11 - Analyzing TiCN Coating Thickness on Cutting Tools Application Bulletin 12 - Identifying Hazardous Substances as Defined in the RoHS 3 Directive Application Bulletin 13 - Analyzing Physical Vapor Deposition (PVD) Coating Thickness Application Bulletin 14 - Thickness Analysis Of Chromate Conversion Coatings Application Bulletin 15: Solder Bump Analysis Application Bulletin 16: Multi-Element Solution Analysis Application Bulletin 17: Coatings on Plastic Substrates Application Bulletin 18: Coatings on Glass Substrates Application Bulletin 19: Platinized Anodes (Pt/Ti) Application Bulletin 20: Rhodium Plating on Gold Alloys for the Jewelry Industry Application Bulletin 21: Failure Analysis of Pb-Free and High Reliability Solders Application Bulletin 22: Polycapillary Optics for Semiconductor Industry Applications Application Bulletin 23: Tin Electroplating over Copper Alloys with Common Elements Project Profile: PCI - Bowman P Series XRF Chosen by Leader in Rigid Flex & Multilayer Boards Projects Profile - Kintech - Ten Long - Bowman Taiwan Proves O Series Superiority for PCB Quality Testing Quality Magazine - The Right Detector - April 2020 Quality Magazine - XRF Analysis: What Labs and Lines Really Want - April 2019 Quality Magazine - With XRF Measurement the Goal is Achieving Low Limits of Detection Precisely and Fast Customer Insights - KEMET Electronics

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K Series Collimated Flyer A Series Flyer XRF Serie G Flyer XRF Serie B Flyer XRF Serie P Flyer XRF Serie O Flyer XRF Serie M Flyer XRF Serie L Flyer XRF Serie W Flyer Fluorescenza A Raggi X Per L’analisi Dei Rivestimenti Bowman Italia Opuscolo Semiconductor Brochure

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Bowman Brochure RoHS Broschüre Halbleiter Broschüre Flyer der K-Serie A-Serie Flyer Flyer der B-Serie Flyer der G-Serie L-Serie Flyer Flyer der M-Serie O-Serie Flyer P-Serie Flyer W-Serie Flyer Applikationsbericht 1 - Chemisch-Nickel-Beschichtungen DEPra Technik Service Flyer Bowman RFA Appliaktionsbericht 1 Bowman RFA Appliaktionsbericht 2 Bowman RFA Appliaktionsbericht 3.1 Bowman RFA Appliaktionsbericht 4 Bowman RFA Appliaktionsbericht 5 Bowman RFA Appliaktionsbericht 6 Bowman RFA Appliaktionsbericht 7 Bowman RFA Appliaktionsbericht 8 Bowman RFA Appliaktionsbericht 9 Bowman RFA Appliaktionsbericht 10 Bowman RFA Appliaktionsbericht 11 Bowman RFA-Applikationsbericht 12

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K Series Collimated Flyer A Series Flyer Bowman Brochure W Series Flyer L Series Flyer O Series Flyer P Series Flyer B Series Flyer P Series Flyer G Series Flyer Application Bulletin 1.1 – Performance on Thin and Thick Electroless Nickel Plating Application Bulletin 2 – ENEPIG Applications Application Bulletin 3.1 – Measurement of ENIG %P Under the Au Layer Application Bulletin 4 – Compliance of Bowman XRF Instruments with IPC-4552 Application Bulletin 5 – Au/Ni/Kovar Application Bulletin 6 - Thickness Measurement of Sn and Ni Layers on Resistors and Capacitors Application Bulletin 7 – Nanometer Level Indium Coating Thickness Measurement for the Automobile Industry Application Bulletin 8 – Measurement of Ni-Cu-Ni In the Magnet Industry Application Bulletin 9 – Composition & Thickness Measurement of Zn-Ni Alloy Coatings Application Bulletin 10 – Termination Plating Analysis of Capacitor – Resistor and Inductor Application Bulletin 11 – Analyzing TiCN Coating Thickness on Cutting Tools Projects Profile – Bowman Taiwan Proves O Series Superiority for PCB Quality Testing Project Profile: PCI – Bowman P Series XRF Chosen by Leader in Rigid Flex & Multilayer Boards Quality Magazine – The Right Detector – April 2020 Quality Magazine – XRF Analysis: What Labs and Lines Really Want – April 2019 Quality Magazine – With XRF Measurement the Goal is Achieving Low Limits of Detection Precisely and Fast Semiconductor Brochure

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K Series Collimated Flyer Bowman Brochure Bowman RoHS Brochure Semiconductor Brochure A Series Flyer W Series Flyer L Series Flyer M Series Flyer O Series Flyer P Series Flyer B Series Flyer G Series Flyer Bowman Application Brief on IPC-4552 Application Bulletin 1.1 - Performance on Thin and Thick Electroless Nickel Plating Application Bulletin 2.1: ENEPIG IPC-4556 Application Bulletin 3.1 - Measurement of ENIG %P Under the Au Layer Application Bulletin 4 - Compliance of Bowman XRF Instruments with IPC-4552 Application Bulletin 5 - Au/Ni/Kovar Application Bulletin 6 - Thickness Measurement of Sn and Ni Layers on Resistors and Capacitors Application Bulletin 7 - Nanometer Level Indium Coating Thickness Measurement for the Automobile Industry Application Bulletin 8.1 - Measurement of Ni-Cu-Ni In the Magnet Industry Application Bulletin 9 - Composition & Thickness Measurement of Zn-Ni Alloy Coatings Application Bulletin 10 - Termination Plating Analysis of Capacitor - Resistor and Inductor Application Bulletin 11 - Analyzing TiCN Coating Thickness on Cutting Tools Application Bulletin 12 - Identifying Hazardous Substances as Defined in the RoHS 3 Directive Project Profile: PCI - Bowman P Series XRF Chosen by Leader in Rigid Flex & Multilayer Boards Projects Profile - Kintech - Ten Long - Bowman Taiwan Proves O Series Superiority for PCB Quality Testing Quality Magazine - The Right Detector - April 2020 Quality Magazine - XRF Analysis: What Labs and Lines Really Want - April 2019 Quality Magazine - With XRF Measurement the Goal is Achieving Low Limits of Detection Precisely and Fast Customer Insights - KEMET Electronics

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K Series Collimated Flyer A Series Flyer Broszura Bowman Ulotka Bowman Serii W Ulotka Bowman Serii L Ulotka Bowman Serii M Ulotka Bowman Serii O Ulotka Bowman Serii P Ulotka Bowman Serii B Ulotka Bowman Serii G Ulotka serwisowa Bowman Anitepo Semiconductor Brochure

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K Series Collimated Flyer A Series Flyer Bowman Brochure Bowman RoHS Brochure W Series Flyer L Series Flyer M Series Flyer O Series Flyer P Series Flyer B Series Flyer G Series Flyer Bowman Application Brief on IPC-4552 Application Bulletin 1.1 - Performance on Thin and Thick Electroless Nickel Plating Application Bulletin 2.1: ENEPIG IPC-4556 Application Bulletin 3.1 - Measurement of ENIG %P Under the Au Layer Application Bulletin 4 - Compliance of Bowman XRF Instruments with IPC-4552 Application Bulletin 5 - Au/Ni/Kovar Application Bulletin 6 - Thickness Measurement of Sn and Ni Layers on Resistors and Capacitors Application Bulletin 7 - Nanometer Level Indium Coating Thickness Measurement for the Automobile Industry Application Bulletin 8.1 - Measurement of Ni-Cu-Ni In the Magnet Industry Application Bulletin 9 - Composition & Thickness Measurement of Zn-Ni Alloy Coatings Application Bulletin 10 - Termination Plating Analysis of Capacitor - Resistor and Inductor Application Bulletin 11 - Analyzing TiCN Coating Thickness on Cutting Tools Project Profile: PCI - Bowman P Series XRF Chosen by Leader in Rigid Flex & Multilayer Boards Projects Profile - Kintech - Ten Long - Bowman Taiwan Proves O Series Superiority for PCB Quality Testing Quality Magazine - The Right Detector - April 2020 Ingeniería De Superficies -En El Análisis Por Fluorescencia De Rayos El Objetivo Principal Es Obtener Unos Límites Bajos De Detección Con Precisión Y Rapidez Quality Magazine - XRF Analysis: What Labs and Lines Really Want - April 2019 Quality Magazine - With XRF Measurement the Goal is Achieving Low Limits of Detection Precisely and Fast Customer Insights - KEMET Electronics

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