Innovative technology combines a small spot, high flux x-ray beam with a large window Silicon Drift Detector (SDD) to achieve unmatched speed, precision and performance.

March, 2017 – Bowman’s M Series µ-spot optics instrument was honored with a New Product Introduction award during the IPC APEX Expo at the San Diego Convention Center. The award, presented by Circuits Assembly and Printed Circuit Design and Fab, was in recognition of the advanced thin film measurement the M Series achieves using µ-spot poly-capillary optics.

An independent panel of practicing industry engineers selected the recipients for this 10th annual award for electronics assembly equipment, materials, software, and PCB fabrication.“We are very excited that the M Series has received this recognition,” said Jun Choi, Bowman Chief Technology Officer. “The innovative technology combines a small spot, high flux x-ray beam with a large window Silicon Drift Detector (SDD) to significantly improve the instrument’s speed, precision and performance.”