January, 2019 – Bowman has re-introduced an important instrument in their suite of 7 benchtop XRF plating measurement systems.
Bowman’s G Series XRF is a robust system that’s ideally suited for jewelry and other precious metal analysis applications, also components such as fasteners and connectors.
Its two most distinctive features are “bottom-up” measurement using a motorized Z-axis with laser-based autofocus, and precision video imaging. An available manual XY stage with 1.5 X 1.5” travel facilitates easy positioning of small and large parts.
The standard G Series configuration includes a single fixed collimator, solid-state PIN detector, and long-life micro-focus x-ray tube. As with all Bowman models, the components can be upgraded to include multiple collimators, a variable focal camera, or an SDD detector.
Like others in the Bowman XRF portfolio, G Series instruments simultaneously measure 5 coating layers, and 10 elements in each layer.